Reliability Robustness and Failure Mechanisms of LED Devices

Written By Yannick Deshayes
Reliability  Robustness and Failure Mechanisms of LED Devices
  • Publsiher : Elsevier
  • Release : 27 March 2017
  • ISBN : 0081010885
  • Pages : 172 pages
  • Rating : 4/5 from 21 reviews
GET THIS BOOKReliability Robustness and Failure Mechanisms of LED Devices


Read or download book entitled Reliability Robustness and Failure Mechanisms of LED Devices written by Yannick Deshayes which was release on 27 March 2017, this book published by Elsevier. Available in PDF, EPUB and Kindle Format. Book excerpt: The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Reliability Robustness and Failure Mechanisms of LED Devices

Reliability  Robustness and Failure Mechanisms of LED Devices
  • Author : Yannick Deshayes,Laurent Bechou
  • Publisher : Elsevier
  • Release Date : 2017-03-27
  • Total pages : 172
  • ISBN : 0081010885
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Summary : The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate ...

Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications
  • Author : Raphael Baillot,Yannick Deshayes
  • Publisher : Elsevier
  • Release Date : 2017-03-09
  • Total pages : 222
  • ISBN : 0081010885
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Summary : Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED ...

Nitride Semiconductor Light Emitting Diodes LEDs

Nitride Semiconductor Light Emitting Diodes  LEDs
  • Author : Jian-Jang Huang,Hao-Chung Kuo,Shyh-Chiang Shen
  • Publisher : Woodhead Publishing
  • Release Date : 2017-10-24
  • Total pages : 822
  • ISBN : 0081010885
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Summary : Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications, Second Edition reviews the fabrication, performance and applications of the technology, encompassing the state-of-the-art material and device development, along with considerations regarding nitride-based LED design. This updated edition is based on the latest research and advances, including two new chapters on ...

Solid State Lighting Reliability Part 2

Solid State Lighting Reliability Part 2
  • Author : Willem Dirk van Driel,Xuejun Fan,Guo Qi Zhang
  • Publisher : Springer
  • Release Date : 2017-07-11
  • Total pages : 606
  • ISBN : 0081010885
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Summary : In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new ...

Solid State Lighting Reliability

Solid State Lighting Reliability
  • Author : W.D. van Driel,X.J. Fan
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-09-06
  • Total pages : 618
  • ISBN : 0081010885
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Summary : Solid State Lighting Reliability: Components to Systems begins with an explanation of the major benefits of solid state lighting (SSL) when compared to conventional lighting systems including but not limited to long useful lifetimes of 50,000 (or more) hours and high efficacy. When designing effective devices that take advantage of SSL ...

mm Wave Silicon Power Amplifiers and Transmitters

mm Wave Silicon Power Amplifiers and Transmitters
  • Author : Hossein Hashemi,Sanjay Raman
  • Publisher : Cambridge University Press
  • Release Date : 2016-04-04
  • Total pages : 495
  • ISBN : 0081010885
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Summary : Build high-performance, energy-efficient circuits with this cutting-edge guide to designing, modeling, analysing, implementing and testing new mm-wave systems....

Reliability of Organic Compounds in Microelectronics and Optoelectronics

Reliability of Organic Compounds in Microelectronics and Optoelectronics
  • Author : Willem Dirk van Driel,Maryam Yazdan Mehr
  • Publisher : Springer Nature
  • Release Date : 2022
  • Total pages : 212
  • ISBN : 0081010885
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Summary : This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples ...

Nitride Semiconductor Technology

Nitride Semiconductor Technology
  • Author : Fabrizio Roccaforte,Michael Leszczynski
  • Publisher : John Wiley & Sons
  • Release Date : 2020-07-17
  • Total pages : 464
  • ISBN : 0081010885
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Summary : The book "Nitride Semiconductor Technology" provides an overview of nitride semiconductors and their uses in optoelectronics and power electronics devices. It explains the physical properties of those materials as well as their growth methods. Their applications in high electron mobility transistors, vertical power devices, LEDs, laser diodes, and vertical-cavity surface-emitting ...

Proceedings

Proceedings
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1998
  • Total pages : 212
  • ISBN : 0081010885
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Summary : Download or read online Proceedings written by , published by which was released on 1998. Get Proceedings Books now! Available in PDF, ePub and Kindle....

Embedded Systems

Embedded Systems
  • Author : James K. Peckol
  • Publisher : John Wiley & Sons
  • Release Date : 2019-04-01
  • Total pages : 1080
  • ISBN : 0081010885
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Summary : Embedded Systems: A Contemporary Design Tool, Second Edition Embedded systems are one of the foundational elements of today’s evolving and growing computer technology. From operating our cars, managing our smart phones, cleaning our homes, or cooking our meals, the special computers we call embedded systems are quietly and unobtrusively ...

Electrostatic Discharge Protection

Electrostatic Discharge Protection
  • Author : Juin J. Liou
  • Publisher : CRC Press
  • Release Date : 2017-12-19
  • Total pages : 304
  • ISBN : 0081010885
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Summary : Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within ...

Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports
  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1982
  • Total pages : 212
  • ISBN : 0081010885
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Summary : Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database....

HEMT Technology and Applications

HEMT Technology and Applications
  • Author : Trupti Ranjan Lenka,Hieu Pham Trung Nguyen
  • Publisher : Springer Nature
  • Release Date : 2022-06-23
  • Total pages : 245
  • ISBN : 0081010885
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Summary : This book covers two broad domains: state-of-the-art research in GaN HEMT and Ga2O3 HEMT. Each technology covers materials system, band engineering, modeling and simulations, fabrication techniques, and emerging applications. The book presents basic operation principles of HEMT, types of HEMT structures, and semiconductor device physics to understand the device ...

ESD

ESD
  • Author : Steven H. Voldman
  • Publisher : John Wiley & Sons
  • Release Date : 2005-12-13
  • Total pages : 420
  • ISBN : 0081010885
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Summary : This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman ...

Semiconductor Device Reliability

Semiconductor Device Reliability
  • Author : A. Christou,B.A. Unger
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-12-06
  • Total pages : 575
  • ISBN : 0081010885
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Summary : This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field ...